Origin of threshold electrons produced in decay of the Xe 4d-1 np resonance

Tomohiro Aoto*, Yasumasa Hikosaka, Richard Hall, Francis Penent, Pascal Lablanquie, Kenji Ito

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

1 被引用数 (Scopus)

抄録

Coincidence spectra of energetic electrons with threshold electrons were measured following photo-excitation of the Xe 4d3/2, 5/2 → np resonances, in order to investigate the origin of threshold electrons, and the mechanism leading to formation of the Xe2+ 5p-2 and 5s-15p-1 final states. A two-step decay process was observed in the production of Xe2+ 5p-2(1D) following decay of the 7p resonance, where the intermediate state is Xe +* 5p-2(1S)8p that autoionizes emitting a pseudo-threshold electron. This process was confirmed in a time-of-flight analysis of the coincidence spectra of the energetic electrons with the threshold photoelectrons. It is suggested that a similar two-step process also contributes to the population of excited Xe2+ states and is the main origin for the production of threshold electrons in decay of the 4d-1 np resonances.

本文言語英語
ページ(範囲)319-323
ページ数5
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
142
3 SPEC. ISS.
DOI
出版ステータス出版済み - 2005/03

ASJC Scopus 主題領域

  • 電子材料、光学材料、および磁性材料
  • 放射線
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 分光学
  • 物理化学および理論化学

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