抄録
Coincidence spectra of energetic electrons with threshold electrons were measured following photo-excitation of the Xe 4d3/2, 5/2 → np resonances, in order to investigate the origin of threshold electrons, and the mechanism leading to formation of the Xe2+ 5p-2 and 5s-15p-1 final states. A two-step decay process was observed in the production of Xe2+ 5p-2(1D) following decay of the 7p resonance, where the intermediate state is Xe +* 5p-2(1S)8p that autoionizes emitting a pseudo-threshold electron. This process was confirmed in a time-of-flight analysis of the coincidence spectra of the energetic electrons with the threshold photoelectrons. It is suggested that a similar two-step process also contributes to the population of excited Xe2+ states and is the main origin for the production of threshold electrons in decay of the 4d-1 np resonances.
本文言語 | 英語 |
---|---|
ページ(範囲) | 319-323 |
ページ数 | 5 |
ジャーナル | Journal of Electron Spectroscopy and Related Phenomena |
巻 | 142 |
号 | 3 SPEC. ISS. |
DOI | |
出版ステータス | 出版済み - 2005/03 |
ASJC Scopus 主題領域
- 電子材料、光学材料、および磁性材料
- 放射線
- 原子分子物理学および光学
- 凝縮系物理学
- 分光学
- 物理化学および理論化学