Origin of threshold electrons produced in decay of the Xe 4d-1 np resonance

Tomohiro Aoto*, Yasumasa Hikosaka, Richard Hall, Francis Penent, Pascal Lablanquie, Kenji Ito

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Coincidence spectra of energetic electrons with threshold electrons were measured following photo-excitation of the Xe 4d3/2, 5/2 → np resonances, in order to investigate the origin of threshold electrons, and the mechanism leading to formation of the Xe2+ 5p-2 and 5s-15p-1 final states. A two-step decay process was observed in the production of Xe2+ 5p-2(1D) following decay of the 7p resonance, where the intermediate state is Xe +* 5p-2(1S)8p that autoionizes emitting a pseudo-threshold electron. This process was confirmed in a time-of-flight analysis of the coincidence spectra of the energetic electrons with the threshold photoelectrons. It is suggested that a similar two-step process also contributes to the population of excited Xe2+ states and is the main origin for the production of threshold electrons in decay of the 4d-1 np resonances.

Original languageEnglish
Pages (from-to)319-323
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume142
Issue number3 SPEC. ISS.
DOIs
StatePublished - 2005/03

Keywords

  • Resonances
  • Threshold electrons
  • Two-step decay

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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