抄録
We have observed peculiar faulted (F) halves of the dimer-adatom-stacking fault (DAS) structure by scanning tunneling microscopy on quenched Si(111) surfaces at 380 °C, and denoted them irregular F-halves (F′). In the F′-halves, the arrangement of adatoms is partially different from that of corresponding regular F-halves and one adatom is missing. We observed single 5×5-F′, 7×7-F′, 9×9-F′, 11×11-F′ and 13×13-F′ in unreconstructed regions, and proposed their structures. Fluctuations in the size and structure of the faulted halves have been observed in real time by rapid imaging at 380 °C. It is found that single odd-sized faulted-halves appearing in the size changes are always the irregular ones.
本文言語 | 英語 |
---|---|
ページ(範囲) | L291-L298 |
ジャーナル | Surface Science |
巻 | 423 |
号 | 2 |
DOI | |
出版ステータス | 出版済み - 1999/03/10 |
ASJC Scopus 主題領域
- 凝縮系物理学
- 表面および界面
- 表面、皮膜および薄膜
- 材料化学