抄録
Flake-shaped fine particles were modified with a thin TiN layer by a hexagonal-barrel-sputtering technique. To determine the optimum sputtering conditions. TiN films were deposited on a glass substrate by the reactive sputtering technique by varying the values of N2 percentage, total pressure, radio-frequency (RF) power, and substrate temperature. From the analysis of XRD patterns, it was determined that a N2 percentage of 25%. a total pressure of 1.2 Pa. a RF power of 200 W, and room temperature were suitable for the preparation of TiN films. Under these optimized conditions. Al flakes were modified with a TiN by the barrel-sputtering technique. The results of optical microscopy. X-ray diffraction measurements, scanning electron microscopy, and energy-dispersive X-ray spectroscopy measurements revealed that the surface of each Al flake was successfully coated uniformly with a TiN layer.
本文言語 | 英語 |
---|---|
ページ(範囲) | 1638-1643 |
ページ数 | 6 |
ジャーナル | Materials Transactions |
巻 | 49 |
号 | 7 |
DOI | |
出版ステータス | 出版済み - 2008/07 |
ASJC Scopus 主題領域
- 材料科学一般
- 凝縮系物理学
- 材料力学
- 機械工学