Abstract
Flake-shaped fine particles were modified with a thin TiN layer by a hexagonal-barrel-sputtering technique. To determine the optimum sputtering conditions. TiN films were deposited on a glass substrate by the reactive sputtering technique by varying the values of N2 percentage, total pressure, radio-frequency (RF) power, and substrate temperature. From the analysis of XRD patterns, it was determined that a N2 percentage of 25%. a total pressure of 1.2 Pa. a RF power of 200 W, and room temperature were suitable for the preparation of TiN films. Under these optimized conditions. Al flakes were modified with a TiN by the barrel-sputtering technique. The results of optical microscopy. X-ray diffraction measurements, scanning electron microscopy, and energy-dispersive X-ray spectroscopy measurements revealed that the surface of each Al flake was successfully coated uniformly with a TiN layer.
Original language | English |
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Pages (from-to) | 1638-1643 |
Number of pages | 6 |
Journal | Materials Transactions |
Volume | 49 |
Issue number | 7 |
DOIs | |
State | Published - 2008/07 |
Keywords
- Barrel-sputtering system
- Coating
- Powdery materials
- Thin films
- Titanium nitride
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering