Suppression of dark-spots formation varied with cathode interface in organic light emitting devices

Y. Motono; S. Naka; H. Qkada; H. Qnnagawa

Suppression of dark-spots formation varied with cathode interface in organic light emitting devices

Y. Motono^*, S. Naka, H. Qkada, H. Qnnagawa

^*この論文の責任著者

工学科　電気電子工学コース

研究成果: 会議への寄与 › 学会論文 › 査読

1 被引用数 (Scopus)

抄録

Suppression of dark spots formation varied with organic layer/ cathode structure has investigated. Basic structure for evaluation was ITO/ TPD+Rubrene/ Alq₃/ (LiF or BCP/LiF or BCP)/ Cathode. Device structure without LiF layer, number of dark spot dramatically decreased while bright-spots appeared. By inserting BCP layer, number of dark-spots also decreased. Dark-spots disappeared for the device with BCP/AINd. Transmission electron microscope observations at the dark-spot and durability test fitted using Weibull distribution also were discussed.

本文言語	英語
ページ	769-770
ページ数	2
出版ステータス	出版済み - 2005
イベント	IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 - Takamatsu, 日本継続期間: 2005/12/06 → 2005/12/09

学会

学会	IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005
国/地域	日本
City	Takamatsu
Period	2005/12/06 → 2005/12/09

ASJC Scopus 主題領域

工学一般

引用スタイル

@conference{d1fe2a82a0dd4f3bbaacc97e684f8f0b,

title = "Suppression of dark-spots formation varied with cathode interface in organic light emitting devices",

abstract = "Suppression of dark spots formation varied with organic layer/ cathode structure has investigated. Basic structure for evaluation was ITO/ TPD+Rubrene/ Alq3/ (LiF or BCP/LiF or BCP)/ Cathode. Device structure without LiF layer, number of dark spot dramatically decreased while bright-spots appeared. By inserting BCP layer, number of dark-spots also decreased. Dark-spots disappeared for the device with BCP/AINd. Transmission electron microscope observations at the dark-spot and durability test fitted using Weibull distribution also were discussed.",

author = "Y. Motono and S. Naka and H. Qkada and H. Qnnagawa",

year = "2005",

language = "英語",

pages = "769--770",

note = "IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005 ; Conference date: 06-12-2005 Through 09-12-2005",

}

TY - CONF

T1 - Suppression of dark-spots formation varied with cathode interface in organic light emitting devices

AU - Motono, Y.

AU - Naka, S.

AU - Qkada, H.

AU - Qnnagawa, H.

PY - 2005

Y1 - 2005

N2 - Suppression of dark spots formation varied with organic layer/ cathode structure has investigated. Basic structure for evaluation was ITO/ TPD+Rubrene/ Alq3/ (LiF or BCP/LiF or BCP)/ Cathode. Device structure without LiF layer, number of dark spot dramatically decreased while bright-spots appeared. By inserting BCP layer, number of dark-spots also decreased. Dark-spots disappeared for the device with BCP/AINd. Transmission electron microscope observations at the dark-spot and durability test fitted using Weibull distribution also were discussed.

AB - Suppression of dark spots formation varied with organic layer/ cathode structure has investigated. Basic structure for evaluation was ITO/ TPD+Rubrene/ Alq3/ (LiF or BCP/LiF or BCP)/ Cathode. Device structure without LiF layer, number of dark spot dramatically decreased while bright-spots appeared. By inserting BCP layer, number of dark-spots also decreased. Dark-spots disappeared for the device with BCP/AINd. Transmission electron microscope observations at the dark-spot and durability test fitted using Weibull distribution also were discussed.

UR - http://www.scopus.com/inward/record.url?scp=33644601655&partnerID=8YFLogxK

M3 - 学会論文

AN - SCOPUS:33644601655

SP - 769

EP - 770

T2 - IDW/AD'05 - 12th International Display Workshops in Conjunction with Asia Display 2005

Y2 - 6 December 2005 through 9 December 2005

ER -

Suppression of dark-spots formation varied with cathode interface in organic light emitting devices

抄録

学会

ASJC Scopus 主題領域

フィンガープリント

引用スタイル