TY - JOUR
T1 - Site-specificity reduction during Auger decay following Si:2p photoionization in Cl3SiSi(CH3)3 vapor
T2 - An interatomic-Coulombic-decay-like process
AU - Nagaoka, Shin ichi
AU - Takahashi, Osamu
AU - Hikosaka, Yasumasa
N1 - Publisher Copyright:
© 2020 Elsevier B.V.
PY - 2020/6/1
Y1 - 2020/6/1
N2 - L23VV Auger decays caused by Si:2p core-level photoionization in Cl3SiSi(CH3)3 vapor have been studied by means of photoelectron Auger-electron coincidence spectroscopy. Upon the Si:2p photoionization, Cl3Si(CH2)nSi(CH3)3 (n = 0–2) shows two core-photoelectron emissions that are distinguishable by the silicon site. Cl3SiCH2CH2Si(CH3)3 (n = 2) and so forth, which have a long inter-site bridge, remember the initially core-ionized silicon-site and show site-specific fragmentation. In contrast, Cl3SiSi(CH3)3, which has direct Si[sbnd]Si bonding (n = 0), forgets the initially core-ionized silicon-site and shows negligible site-specificity in the final fragmentation stage. A reduction of the site specificity in Cl3SiSi(CH3)3 starts during a Si:L23VV Auger decay and its reduction process can be explained in terms of an interatomic-Coulombic-decay-like mechanism. Another site-specificity reduction, caused by inter-site energy randomization, occurs after every Si:L23VV Auger decay.
AB - L23VV Auger decays caused by Si:2p core-level photoionization in Cl3SiSi(CH3)3 vapor have been studied by means of photoelectron Auger-electron coincidence spectroscopy. Upon the Si:2p photoionization, Cl3Si(CH2)nSi(CH3)3 (n = 0–2) shows two core-photoelectron emissions that are distinguishable by the silicon site. Cl3SiCH2CH2Si(CH3)3 (n = 2) and so forth, which have a long inter-site bridge, remember the initially core-ionized silicon-site and show site-specific fragmentation. In contrast, Cl3SiSi(CH3)3, which has direct Si[sbnd]Si bonding (n = 0), forgets the initially core-ionized silicon-site and shows negligible site-specificity in the final fragmentation stage. A reduction of the site specificity in Cl3SiSi(CH3)3 starts during a Si:L23VV Auger decay and its reduction process can be explained in terms of an interatomic-Coulombic-decay-like mechanism. Another site-specificity reduction, caused by inter-site energy randomization, occurs after every Si:L23VV Auger decay.
KW - Core-level photoionization
KW - Interatomic Coulombic decay
KW - Photoelectron Auger-electron coincidence spectroscopy
KW - Si-containing molecule
KW - Site-specific fragmentation
UR - http://www.scopus.com/inward/record.url?scp=85082699607&partnerID=8YFLogxK
U2 - 10.1016/j.chemphys.2020.110756
DO - 10.1016/j.chemphys.2020.110756
M3 - 学術論文
AN - SCOPUS:85082699607
SN - 0301-0104
VL - 534
JO - Chemical Physics
JF - Chemical Physics
M1 - 110756
ER -