Single, double, and triple Auger decay of the Xe 4p core-hole states

Y. Hikosaka*, P. Lablanquie, F. Penent, T. Kaneyasu, E. Shigemasa, J. H.D. Eland, T. Aoto, K. Ito

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

32 被引用数 (Scopus)

抄録

Auger decay of Xe+ states arising from 4p ionization has been studied with a very efficient multielectron coincidence method. Coster-Kronig decay from Xe+ 4 p-1 and the subsequent decay into Xe3+ states with three valence holes are identified. Formation of Xe4+ is also observed as quadruple coincidences between a 4p photoelectron and three Auger electrons. The relative probabilities of individual multi-ionization processes are determined from the coincidence yields.

本文言語英語
論文番号032708
ジャーナルPhysical Review A - Atomic, Molecular, and Optical Physics
76
3
DOI
出版ステータス出版済み - 2007/09/13

ASJC Scopus 主題領域

  • 原子分子物理学および光学

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