Self-calibrating A/D converter using T-model neural network

Zheng Tang; Yuichi Shirata; Okihiko Ishizuka; Koichi Tanno

Self-calibrating A/D converter using T-model neural network

Zheng Tang^*, Yuichi Shirata, Okihiko Ishizuka, Koichi Tanno

^*この論文の責任著者

工学科　知能情報工学コース

研究成果: ジャーナルへの寄稿 › 会議記事 › 査読

1 被引用数 (Scopus)

抄録

A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.

本文言語	英語
ページ（範囲）	533-536
ページ数	4
ジャーナル	Proceedings - IEEE International Symposium on Circuits and Systems
巻	1
出版ステータス	出版済み - 1995
イベント	Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) - Seattle, WA, USA 継続期間: 1995/04/30 → 1995/05/03

ASJC Scopus 主題領域

電子工学および電気工学

引用スタイル

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abstract = "A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.",

author = "Zheng Tang and Yuichi Shirata and Okihiko Ishizuka and Koichi Tanno",

year = "1995",

language = "英語",

volume = "1",

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journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

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note = "Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) ; Conference date: 30-04-1995 Through 03-05-1995",

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AU - Tang, Zheng

AU - Shirata, Yuichi

AU - Ishizuka, Okihiko

AU - Tanno, Koichi

PY - 1995

Y1 - 1995

N2 - A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.

AB - A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.

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M3 - 会議記事

AN - SCOPUS:0029205184

SN - 0271-4310

VL - 1

SP - 533

EP - 536

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

T2 - Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3)

Y2 - 30 April 1995 through 3 May 1995

ER -

Self-calibrating A/D converter using T-model neural network

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ASJC Scopus 主題領域

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引用スタイル