Self-calibrating A/D converter using T-model neural network

Zheng Tang; Yuichi Shirata; Okihiko Ishizuka; Koichi Tanno

Self-calibrating A/D converter using T-model neural network

Zheng Tang^*, Yuichi Shirata, Okihiko Ishizuka, Koichi Tanno

^*Corresponding author for this work

Intellectual Information Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.

Original language	English
Pages (from-to)	533-536
Number of pages	4
Journal	Proceedings - IEEE International Symposium on Circuits and Systems
Volume	1
State	Published - 1995
Event	Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) - Seattle, WA, USA Duration: 1995/04/30 → 1995/05/03

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{f9e02c9d45bb45198d6f9c6f6414f380,

title = "Self-calibrating A/D converter using T-model neural network",

abstract = "A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.",

author = "Zheng Tang and Yuichi Shirata and Okihiko Ishizuka and Koichi Tanno",

year = "1995",

language = "英語",

volume = "1",

pages = "533--536",

journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

issn = "0271-4310",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) ; Conference date: 30-04-1995 Through 03-05-1995",

}

TY - JOUR

T1 - Self-calibrating A/D converter using T-model neural network

AU - Tang, Zheng

AU - Shirata, Yuichi

AU - Ishizuka, Okihiko

AU - Tanno, Koichi

PY - 1995

Y1 - 1995

N2 - A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.

AB - A self-calibrating analog-to-digital (A/D) converter employing a T-Model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-Model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration.

UR - http://www.scopus.com/inward/record.url?scp=0029205184&partnerID=8YFLogxK

M3 - 会議記事

AN - SCOPUS:0029205184

SN - 0271-4310

VL - 1

SP - 533

EP - 536

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

T2 - Proceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3)

Y2 - 30 April 1995 through 3 May 1995

ER -

Self-calibrating A/D converter using T-model neural network

Abstract

ASJC Scopus subject areas

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