@inproceedings{e1959ee3badc436c96a03b55d2d93c06,
title = "PCI effects on coincidence spectra associated with the emission of two Auger electrons",
abstract = "Experimental investigation of the threshold electron / fast electron coincidences allows one to select lines which axe associated with two Auger electron emission. Such an investigation carried out for near threshold photoionization of Xe Ad shell reveals a considerable distortion of the lineshapes due to Post Collision Interaction (PCI). Analysis of the PCI influence on the Auger lineshapes allows us to clarify dynamics of the two Auger electron ejection. Our study shows that both double Auger decay (DA) and cascade Auger decay (CA) could contribute to the dynamics of the decay process.",
author = "S. Sheinerman and P. Lablanquie and F. Penent and Hall, {R. I.} and M. Ahmad and Y. Hikosaka and K. Ito",
note = "Publisher Copyright: {\textcopyright} 2003 American Institute of Physics; 19th International Conference on X-Ray and Inner-Shell Processes ; Conference date: 24-06-2002 Through 28-06-2002",
year = "2003",
month = jan,
day = "24",
doi = "10.1063/1.1536389",
language = "英語",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
pages = "301--306",
editor = "Antonio Bianconi and Augusto Marcelli and Saini, {Naurang L.}",
booktitle = "X-Ray and Inner-Shell Processes",
}