@article{5dc03cd0e2f545a7ac2142875e18a5c9,
title = "Millimeter-wave scanning near-field anisotropy microscopy",
abstract = "A millimeter-wave scanning near-field microscopy using a slit-type probe, which permits the observation of electrical anisotropy in the viewed object, is proposed. The slit probe is sensitive to any electrical anisotropy along the object surface direction that is inherent in the object to be imaged, because the electric field at its aperture is linearly polarized. An electrical anisotropy model is incorporated into the image reconstruction process that enables two-dimensional image reconstruction. The details of the model and the reconstruction method adopted in this work are described and experimental results to demonstrate the feasibility of this microscopy format are presented.",
author = "Tatsuo Nozokido and Ryohei Iibuchi and Jongsuck Bae and Koji Mizuno and Hiroyuki Kudo",
note = "Funding Information: The authors wish to thank T. Nose, Akita Prefectural University, Akita, Japan, for helpful discussions. This work was supported in part by a Grant-In-Aid for Scientific Research, No. 15360181 from the Japan Society for the Promotion of Science (JSPS), the Support Center for Advanced Telecommunications Technology Research, Foundation (SCAT), Japan, and a Strategic Information and Communications R&D Promotion Programme (SCOPE) of the Ministry of Public Management, Home Affairs, Posts and Telecommunications (MPHPT), Japan.",
year = "2005",
month = mar,
doi = "10.1063/1.1866255",
language = "英語",
volume = "76",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics",
number = "3",
}