Millimeter-wave scanning near-field anisotropy microscopy

Tatsuo Nozokido; Ryohei Iibuchi; Jongsuck Bae; Koji Mizuno; Hiroyuki Kudo

doi:10.1063/1.1866255

Millimeter-wave scanning near-field anisotropy microscopy

Tatsuo Nozokido^*, Ryohei Iibuchi, Jongsuck Bae, Koji Mizuno, Hiroyuki Kudo

^*Corresponding author for this work

Electric and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

A millimeter-wave scanning near-field microscopy using a slit-type probe, which permits the observation of electrical anisotropy in the viewed object, is proposed. The slit probe is sensitive to any electrical anisotropy along the object surface direction that is inherent in the object to be imaged, because the electric field at its aperture is linearly polarized. An electrical anisotropy model is incorporated into the image reconstruction process that enables two-dimensional image reconstruction. The details of the model and the reconstruction method adopted in this work are described and experimental results to demonstrate the feasibility of this microscopy format are presented.

Original language	English
Article number	033702
Journal	Review of Scientific Instruments
Volume	76
Issue number	3
DOIs	https://doi.org/10.1063/1.1866255
State	Published - 2005/03

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1866255

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@article{5dc03cd0e2f545a7ac2142875e18a5c9,

title = "Millimeter-wave scanning near-field anisotropy microscopy",

abstract = "A millimeter-wave scanning near-field microscopy using a slit-type probe, which permits the observation of electrical anisotropy in the viewed object, is proposed. The slit probe is sensitive to any electrical anisotropy along the object surface direction that is inherent in the object to be imaged, because the electric field at its aperture is linearly polarized. An electrical anisotropy model is incorporated into the image reconstruction process that enables two-dimensional image reconstruction. The details of the model and the reconstruction method adopted in this work are described and experimental results to demonstrate the feasibility of this microscopy format are presented.",

author = "Tatsuo Nozokido and Ryohei Iibuchi and Jongsuck Bae and Koji Mizuno and Hiroyuki Kudo",

note = "Funding Information: The authors wish to thank T. Nose, Akita Prefectural University, Akita, Japan, for helpful discussions. This work was supported in part by a Grant-In-Aid for Scientific Research, No. 15360181 from the Japan Society for the Promotion of Science (JSPS), the Support Center for Advanced Telecommunications Technology Research, Foundation (SCAT), Japan, and a Strategic Information and Communications R&D Promotion Programme (SCOPE) of the Ministry of Public Management, Home Affairs, Posts and Telecommunications (MPHPT), Japan.",

year = "2005",

month = mar,

doi = "10.1063/1.1866255",

language = "英語",

volume = "76",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "3",

}

TY - JOUR

T1 - Millimeter-wave scanning near-field anisotropy microscopy

AU - Nozokido, Tatsuo

AU - Iibuchi, Ryohei

AU - Bae, Jongsuck

AU - Mizuno, Koji

AU - Kudo, Hiroyuki

N1 - Funding Information: The authors wish to thank T. Nose, Akita Prefectural University, Akita, Japan, for helpful discussions. This work was supported in part by a Grant-In-Aid for Scientific Research, No. 15360181 from the Japan Society for the Promotion of Science (JSPS), the Support Center for Advanced Telecommunications Technology Research, Foundation (SCAT), Japan, and a Strategic Information and Communications R&D Promotion Programme (SCOPE) of the Ministry of Public Management, Home Affairs, Posts and Telecommunications (MPHPT), Japan.

PY - 2005/3

Y1 - 2005/3

N2 - A millimeter-wave scanning near-field microscopy using a slit-type probe, which permits the observation of electrical anisotropy in the viewed object, is proposed. The slit probe is sensitive to any electrical anisotropy along the object surface direction that is inherent in the object to be imaged, because the electric field at its aperture is linearly polarized. An electrical anisotropy model is incorporated into the image reconstruction process that enables two-dimensional image reconstruction. The details of the model and the reconstruction method adopted in this work are described and experimental results to demonstrate the feasibility of this microscopy format are presented.

AB - A millimeter-wave scanning near-field microscopy using a slit-type probe, which permits the observation of electrical anisotropy in the viewed object, is proposed. The slit probe is sensitive to any electrical anisotropy along the object surface direction that is inherent in the object to be imaged, because the electric field at its aperture is linearly polarized. An electrical anisotropy model is incorporated into the image reconstruction process that enables two-dimensional image reconstruction. The details of the model and the reconstruction method adopted in this work are described and experimental results to demonstrate the feasibility of this microscopy format are presented.

UR - http://www.scopus.com/inward/record.url?scp=17044424495&partnerID=8YFLogxK

U2 - 10.1063/1.1866255

DO - 10.1063/1.1866255

M3 - 学術論文

AN - SCOPUS:17044424495

SN - 0034-6748

VL - 76

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

M1 - 033702

ER -

Millimeter-wave scanning near-field anisotropy microscopy

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