Marker detection in blurred images for high-precision measurement

Kenji Terabayashi, Yuuki Hamamoto, Kazuya Ogasawara, Takaaki Oiwa, Tohru Sasaki

研究成果: 書籍の章/レポート/会議録会議への寄与査読

抄録

In this paper, we propose a method to detect markers in blurred images with high precision. An image blur decreases contrast between a marker and background. This leads to an increase of uncertainty of the marker position. The proposed method reduces the increase of uncertainty of detecting marker position with an increase of image blur. The proposed method estimates degrees of image blur by analysing intensity distribution of the marker contour. The estimated degrees of image blur are used for controlling the window size of edge detection on the marker contour. This adaptive control makes edge detection in blur images precisely. The proposed method of marker detection with the adaptive control minimizes the effect of image blur on precision of the detected marker position. In focused images, fluorescent spherical markers were detected with precision of 1.7 × 10-3 pixels. In images blurred with 19 pixels, fluorescent spherical markers were detected with precision of 2.5 × 10-3 pixels with the proposed method, in contrast, with precision of 11 × 10-3 pixels with a conventional detection method. In images blurred with 27 pixels, fluorescent spherical markers were detected with precision of 4.0 × 10-3 pixels with the proposed method, in contrast, with precision of 25 × 10-3 pixels with a conventional detection method. These results show the effectiveness of the proposed method on precise marker detection in blurred images.

本文言語英語
ホスト出版物のタイトルEuropean Society for Precision Engineering and Nanotechnology, Conference Proceedings - 23rd International Conference and Exhibition, EUSPEN 2023
編集者O. Riemer, C. Nisbet, D. Phillips
出版社euspen
ページ229-230
ページ数2
ISBN(電子版)9781998999132
出版ステータス出版済み - 2023
イベント23rd International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2023 - Copenhagen, デンマーク
継続期間: 2023/06/122023/06/16

出版物シリーズ

名前European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 23rd International Conference and Exhibition, EUSPEN 2023

学会

学会23rd International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2023
国/地域デンマーク
CityCopenhagen
Period2023/06/122023/06/16

ASJC Scopus 主題領域

  • 産業および生産工学
  • 機械工学
  • 環境工学
  • 材料科学一般
  • 器械工学

フィンガープリント

「Marker detection in blurred images for high-precision measurement」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル