TY - JOUR
T1 - Influence of hydrocarbons on element detection in ion images by SIMS microscopy
AU - Takaya, Kenichi
AU - Okabe, Motonori
AU - Sawataishi, Masaru
AU - Yoshida, Toshiko
PY - 2004/6/15
Y1 - 2004/6/15
N2 - Ion microscopy on fresh frozen cryostat sections, 5-10μm thick, is useful to determine the distribution of elements and low molecular organic compounds in the larger areas of the tissues. Fresh frozen cryostat sections of tree frog eyeball were examined. Secondary ion images of Na, Mg, Al, C 2 H 3 , K, Ca and C 3 H 5 were observed by ion microscopy (IMS-6f) using O 2 + as the primary beam source at an energy of 15keV. The primary beam current was 10 -10 A, the ion image magnification was varied from 300 to 1500 and the mass resolution was set between 300 and 3000. The areas of high intensity ion counts of the organic compounds generally showed low ion counts of elements. After long exposure to the primary ion beam, the intensity of the organic compound ions decreased, whereas the intensity of atomic ions of elements increased.
AB - Ion microscopy on fresh frozen cryostat sections, 5-10μm thick, is useful to determine the distribution of elements and low molecular organic compounds in the larger areas of the tissues. Fresh frozen cryostat sections of tree frog eyeball were examined. Secondary ion images of Na, Mg, Al, C 2 H 3 , K, Ca and C 3 H 5 were observed by ion microscopy (IMS-6f) using O 2 + as the primary beam source at an energy of 15keV. The primary beam current was 10 -10 A, the ion image magnification was varied from 300 to 1500 and the mass resolution was set between 300 and 3000. The areas of high intensity ion counts of the organic compounds generally showed low ion counts of elements. After long exposure to the primary ion beam, the intensity of the organic compound ions decreased, whereas the intensity of atomic ions of elements increased.
KW - Cryostat sections
KW - Elements
KW - High mass resolution
KW - Ion images
KW - Ion microscopy
KW - Organic substances
UR - http://www.scopus.com/inward/record.url?scp=2942538069&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2004.03.198
DO - 10.1016/j.apsusc.2004.03.198
M3 - 学術論文
AN - SCOPUS:2942538069
SN - 0169-4332
VL - 231-232
SP - 502
EP - 505
JO - Applied Surface Science
JF - Applied Surface Science
ER -