Influence of annealing on microstructure and NO2-sensing properties of sputtered WO3 thin films

Zhifu Liu*, Toshinai Yamazaki, Yanbai Shen, Toshio Kikuta, Noriyuki Nakatani

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

98 被引用数 (Scopus)

抄録

The influences of thermal annealing on the microstructure and NO2-sensing properties of sputtered WO3 thin films were investigated. The WO3 films as-deposited at room temperature were amorphous and would crystallize to monoclinic structure when annealed at 350 °C or above. The grains and pores in the WO3 films grew larger with an increase in annealing temperature. The effective surface area and pore volume changed non-monotonously with increasing the annealing temperature. The film annealed at 350 °C showed the largest effective surface area. The film annealed at 500 °C had the largest pore volume. Among the films investigated in this study, the WO3 thin film annealed at 500 °C showed the quickest response/recovery and the highest response to 10 ppm NO2. These results indicate the importance of achieving porous structure on improving the gas sensing performance.

本文言語英語
ページ(範囲)173-178
ページ数6
ジャーナルSensors and Actuators, B: Chemical
128
1
DOI
出版ステータス出版済み - 2007/12/12

ASJC Scopus 主題領域

  • 電子材料、光学材料、および磁性材料
  • 器械工学
  • 凝縮系物理学
  • 表面、皮膜および薄膜
  • 金属および合金
  • 電子工学および電気工学
  • 材料化学

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