Influence of annealing on microstructure and NO2-sensing properties of sputtered WO3 thin films

Zhifu Liu*, Toshinai Yamazaki, Yanbai Shen, Toshio Kikuta, Noriyuki Nakatani

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

98 Scopus citations

Abstract

The influences of thermal annealing on the microstructure and NO2-sensing properties of sputtered WO3 thin films were investigated. The WO3 films as-deposited at room temperature were amorphous and would crystallize to monoclinic structure when annealed at 350 °C or above. The grains and pores in the WO3 films grew larger with an increase in annealing temperature. The effective surface area and pore volume changed non-monotonously with increasing the annealing temperature. The film annealed at 350 °C showed the largest effective surface area. The film annealed at 500 °C had the largest pore volume. Among the films investigated in this study, the WO3 thin film annealed at 500 °C showed the quickest response/recovery and the highest response to 10 ppm NO2. These results indicate the importance of achieving porous structure on improving the gas sensing performance.

Original languageEnglish
Pages (from-to)173-178
Number of pages6
JournalSensors and Actuators, B: Chemical
Volume128
Issue number1
DOIs
StatePublished - 2007/12/12

Keywords

  • Annealing
  • NO sensor
  • Pore size
  • Surface area
  • WO thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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