抄録
Spectra of highly charged ions in the extreme ultraviolet range were observed using high- and low-energy electron beam ion traps (EBITs) in Tokyo. For efficient observation, a slitless grazing incidence flat field spectrometer was specially designed for each EBIT. The present results demonstrate that the complementary use of these spectrometers enable spectroscopic studies of ions with a wide range of charge states.
本文言語 | 英語 |
---|---|
論文番号 | 014031 |
ジャーナル | Physica Scripta T |
巻 | T144 |
DOI | |
出版ステータス | 出版済み - 2011 |
イベント | 15th International Conference on the Physics of Highly Charged Ions, HCI2010 - Shanghai, 中国 継続期間: 2010/08/29 → 2010/09/03 |
ASJC Scopus 主題領域
- 原子分子物理学および光学
- 数理物理学
- 凝縮系物理学