抄録
Ultrasonic measurement was performed on Kondo semiconductor CeOs 4Sb12 to investigate the elastic property. A distinct elastic softening toward low temperatures was observed in C11, whereas no softening was observed in C44. The obtained results were not explained reasonably based on the crystalline electric field effect, indicating that the softening is ascribed to another origin. Since CeOs4Sb12 is likely to form the narrow quasiparticle band, the coupling between elastic strain and the band may play a crucial role. We discuss the origin of the distinct softening in C11 from the view of this coupling.
本文言語 | 英語 |
---|---|
ページ(範囲) | 907-909 |
ページ数 | 3 |
ジャーナル | Physica B: Condensed Matter |
巻 | 359-361 |
号 | SPEC. ISS. |
DOI | |
出版ステータス | 出版済み - 2005/04/30 |
ASJC Scopus 主題領域
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- 電子工学および電気工学