Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole

S. Sheinerman; F. Penent; R. I. Hall; M. Ahmad; Y. Hikosaka; K. Ito; P. Lablanquie

Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole

S. Sheinerman, F. Penent, R. I. Hall, M. Ahmad, Y. Hikosaka, K. Ito, P. Lablanquie

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研究成果: ジャーナルへの寄稿 › 学術論文 › 査読

抄録

Two electron Auger decay of the 4d innershell hole in xenon formed by photon absorption leading to the emission of a slow and a fast electron was observed in the threshold region. The observed line shapes of the fast electron are strongly affected by PCI. Theory showed that these line shapes depend on the nature and dynamics of the decay process. It was determined that two electron Auger decay is dominated by the cascade process with initial ejection of the slow electron.

本文言語	英語
論文番号	053001
ページ（範囲）	053001/1-053001/4
ジャーナル	Physical Review Letters
巻	87
号	5
出版ステータス	出版済み - 2001/07/30

ASJC Scopus 主題領域

物理学および天文学一般

引用スタイル

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title = "Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole",

abstract = "Two electron Auger decay of the 4d innershell hole in xenon formed by photon absorption leading to the emission of a slow and a fast electron was observed in the threshold region. The observed line shapes of the fast electron are strongly affected by PCI. Theory showed that these line shapes depend on the nature and dynamics of the decay process. It was determined that two electron Auger decay is dominated by the cascade process with initial ejection of the slow electron.",

author = "S. Sheinerman and F. Penent and Hall, {R. I.} and M. Ahmad and Y. Hikosaka and K. Ito and P. Lablanquie",

year = "2001",

month = jul,

day = "30",

language = "英語",

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pages = "053001/1--053001/4",

journal = "Physical Review Letters",

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T1 - Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole

AU - Sheinerman, S.

AU - Penent, F.

AU - Hall, R. I.

AU - Ahmad, M.

AU - Hikosaka, Y.

AU - Ito, K.

AU - Lablanquie, P.

PY - 2001/7/30

Y1 - 2001/7/30

N2 - Two electron Auger decay of the 4d innershell hole in xenon formed by photon absorption leading to the emission of a slow and a fast electron was observed in the threshold region. The observed line shapes of the fast electron are strongly affected by PCI. Theory showed that these line shapes depend on the nature and dynamics of the decay process. It was determined that two electron Auger decay is dominated by the cascade process with initial ejection of the slow electron.

AB - Two electron Auger decay of the 4d innershell hole in xenon formed by photon absorption leading to the emission of a slow and a fast electron was observed in the threshold region. The observed line shapes of the fast electron are strongly affected by PCI. Theory showed that these line shapes depend on the nature and dynamics of the decay process. It was determined that two electron Auger decay is dominated by the cascade process with initial ejection of the slow electron.

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M3 - 学術論文

AN - SCOPUS:84988788346

SN - 0031-9007

VL - 87

SP - 053001/1-053001/4

JO - Physical Review Letters

JF - Physical Review Letters

IS - 5

M1 - 053001

ER -

Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole

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