Dynamics and post-collision interaction effects in two electron decay from the xenon 4d hole

P. Lablanquie, S. Sheinerman, F. Penent, R. I. Hall, M. Ahmad, Y. Hikosaka, K. Ito

研究成果: ジャーナルへの寄稿学術論文査読

2 被引用数 (Scopus)

抄録

Two Auger electrons, one very slow, one fast, have been detected in coincidence following near threshold 4d photoionization of the Xe atom. The distribution in the energy the two electrons share has been measured for the first time revealing the presence of post-collision interaction effects that provide unique information on the decay dynamics of the 4d hole. Analysis of the distorted line shapes indicates that the dominant process is decay of Xe+(4d−1) to Xe3+ through cascade emission of a zero kinetic energy Auger electron followed by a fast Auger electron. The widths of the intermediate Xe2+* states are estimated to be about 60meV.

本文言語英語
ページ(範囲)53001-1-53001-4
ジャーナルPhysical Review Letters
87
5
DOI
出版ステータス出版済み - 2001/07/30

ASJC Scopus 主題領域

  • 物理学および天文学一般

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