TY - GEN
T1 - Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe
AU - Nozokido, Tatsuo
AU - Ishino, Manabu
AU - Bae, Jongsuck
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/28
Y1 - 2016/11/28
N2 - We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.
AB - We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.
UR - http://www.scopus.com/inward/record.url?scp=85006100728&partnerID=8YFLogxK
U2 - 10.1109/IRMMW-THz.2016.7758622
DO - 10.1109/IRMMW-THz.2016.7758622
M3 - 会議への寄与
AN - SCOPUS:85006100728
T3 - International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
BT - 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
PB - IEEE Computer Society
T2 - 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Y2 - 25 September 2016 through 30 September 2016
ER -