Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe

Tatsuo Nozokido; Manabu Ishino; Jongsuck Bae

doi:10.1109/IRMMW-THz.2016.7758622

Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe

Tatsuo Nozokido, Manabu Ishino, Jongsuck Bae

Electric and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.

Original language	English
Title of host publication	41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Publisher	IEEE Computer Society
ISBN (Electronic)	9781467384858
DOIs	https://doi.org/10.1109/IRMMW-THz.2016.7758622
State	Published - 2016/11/28
Event	41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 - Copenhagen, Denmark Duration: 2016/09/25 → 2016/09/30

Publication series

Name	International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume	2016-November
ISSN (Print)	2162-2027
ISSN (Electronic)	2162-2035

Conference

Conference	41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Country/Territory	Denmark
City	Copenhagen
Period	2016/09/25 → 2016/09/30

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/IRMMW-THz.2016.7758622

Cite this

Nozokido, T., Ishino, M., & Bae, J. (2016). Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe. In 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 Article 7758622 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; Vol. 2016-November). IEEE Computer Society. https://doi.org/10.1109/IRMMW-THz.2016.7758622

@inproceedings{fd13dbdd0532474c8e5b2ed4729fd02a,

title = "Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe",

abstract = "We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.",

author = "Tatsuo Nozokido and Manabu Ishino and Jongsuck Bae",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 ; Conference date: 25-09-2016 Through 30-09-2016",

year = "2016",

month = nov,

day = "28",

doi = "10.1109/IRMMW-THz.2016.7758622",

language = "英語",

series = "International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz",

publisher = "IEEE Computer Society",

booktitle = "41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016",

}

Nozokido, T, Ishino, M & Bae, J 2016, Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe. in 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016., 7758622, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, vol. 2016-November, IEEE Computer Society, 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016, Copenhagen, Denmark, 2016/09/25. https://doi.org/10.1109/IRMMW-THz.2016.7758622

Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe. / Nozokido, Tatsuo; Ishino, Manabu; Bae, Jongsuck.
41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016. IEEE Computer Society, 2016. 7758622 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz; Vol. 2016-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe

AU - Nozokido, Tatsuo

AU - Ishino, Manabu

AU - Bae, Jongsuck

PY - 2016/11/28

Y1 - 2016/11/28

N2 - We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.

AB - We report on an analytical method for investigating the signal contrast obtained in near-field scanning millimeter-wave microscopy using a metal slit probe. The probe has a slit-like aperture at the open end of a rectangular metal waveguide. In our method, the electromagnetic field around the slit aperture at the probe tip is calculated from Maxwell's equations in the Fourier (wavenumber) domain in order to derive the electrical admittance of a sample system consisting of layered dielectrics as seen from the probe tip. An equivalent two-port electrical circuit of the probe waveguide terminated by this admittance is then used to calculate the complex reflection coefficient of the probe as a signal. The validity of the method is verified by experiments.

UR - http://www.scopus.com/inward/record.url?scp=85006100728&partnerID=8YFLogxK

U2 - 10.1109/IRMMW-THz.2016.7758622

DO - 10.1109/IRMMW-THz.2016.7758622

M3 - 会議への寄与

AN - SCOPUS:85006100728

T3 - International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz

BT - 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016

PB - IEEE Computer Society

T2 - 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016

Y2 - 25 September 2016 through 30 September 2016

ER -

Contrast of near-field scanning millimeter-wave microscopy using a metal slit probe

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