Carrier conduction characteristics in P3HT: PCBM bulk heterojunction structures under sunlight illumination

Yanhui Lou*, Zhaokui Wang, Shigeki Naka, Hiroyuki Okada

*この論文の責任著者

研究成果: ジャーナルへの寄稿会議記事査読

1 被引用数 (Scopus)

抄録

Injection properties of electrons and holes at the interface of electrodes/active layer for blending poly(3-hexylthiophene) (P3HT) and methanofullerene [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) based on structures of Au/MoO3/P3HT: PCBM/ MoO3/Au as hole dominated device and Al alloy/P3HT: PCBM/Al alloy as electron dominated device were investigated. Both of hole and electron injections were ascribed to Schottky thermionic emission mechanism. The barrier height of carrier injection was estimated under a simulated air mass (AM) 1.5G spectrum illumination and dark conditions, respectively. The interfacial state at Al alloys/ P3HT: PCBM interface was estimated to be 1.4 × 1014 states/cm 2/eV under illumination by extrapolating the relation of electron barrier heights and work functions using different Al alloys.

本文言語英語
ページ(範囲)204-208
ページ数5
ジャーナルPhysics Procedia
14
DOI
出版ステータス出版済み - 2011
イベント9th International Conference on Nano-Molecular Electronics, ICNME 2010 - Kobe, 日本
継続期間: 2010/12/142010/12/16

ASJC Scopus 主題領域

  • 物理学および天文学一般

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