Abstract
Cr-Si metastable alloys were prepared by RF sputtering in a low-pressure argon gas. The structure of sputtered alloys results in Cr (Si) solid solution, Cr+Cr3Si, the amorphous phase with increasing Si content for Cr-Si alloys. The dissolution hardening effect of Si increases the microhardness of Cr(Si) solid solution. The microhardness of Cr-Si sputtered alloys yields the peak around 50 at% Si, and furthermore, the microhardness of Cr-Si alloy, with Si rich content of 80at% or more increases with Si content. These results suggest that the bonding character of Cr-Si amorphous alloys is different from the metallic-to-covalent bonding of Si-rich alloys. This bonding character difference for Cr-Si rich alloys is also seen in the Si content dependence of the crystallization temperatures for Cr-Si alloys.
Original language | English |
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Pages (from-to) | 503-507 |
Number of pages | 5 |
Journal | Vacuum |
Volume | 65 |
Issue number | 3-4 |
DOIs | |
State | Published - 2002/05/27 |
Event | 3th International Symposium on Applied Plasma Science - Fairbanks, AK, United States Duration: 2001/07/02 → 2001/07/06 |
Keywords
- Chromium
- Hardness
- Metastable materials
- Silicon
- Sputtering
- Thermal stability
ASJC Scopus subject areas
- Instrumentation
- Condensed Matter Physics
- Surfaces, Coatings and Films