Formation and properties of Cr-Si sputtered alloys

Masaaki Naka*, M. Maeda, T. Shibayanagi, H. Yuan, H. Mori

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

10 Scopus citations

Abstract

Cr-Si metastable alloys were prepared by RF sputtering in a low-pressure argon gas. The structure of sputtered alloys results in Cr (Si) solid solution, Cr+Cr3Si, the amorphous phase with increasing Si content for Cr-Si alloys. The dissolution hardening effect of Si increases the microhardness of Cr(Si) solid solution. The microhardness of Cr-Si sputtered alloys yields the peak around 50 at% Si, and furthermore, the microhardness of Cr-Si alloy, with Si rich content of 80at% or more increases with Si content. These results suggest that the bonding character of Cr-Si amorphous alloys is different from the metallic-to-covalent bonding of Si-rich alloys. This bonding character difference for Cr-Si rich alloys is also seen in the Si content dependence of the crystallization temperatures for Cr-Si alloys.

Original languageEnglish
Pages (from-to)503-507
Number of pages5
JournalVacuum
Volume65
Issue number3-4
DOIs
StatePublished - 2002/05/27
Event3th International Symposium on Applied Plasma Science - Fairbanks, AK, United States
Duration: 2001/07/022001/07/06

Keywords

  • Chromium
  • Hardness
  • Metastable materials
  • Silicon
  • Sputtering
  • Thermal stability

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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