Abstract
The local structure of bismuth film deposited at liquid nitrogen temperature was investigated by the extended X-ray absorption fine structure (EXAFS) analysis. In the Fourier transform of EXAFS function the peak originated from the intralayer first nearest neighbor (1NN) correlation exists while that originated from the interlayer 1NN correlation disappears. This suggests that the primary structure remains but the secondary structure is disrupted.
| Original language | English |
|---|---|
| Pages (from-to) | 110-112 |
| Number of pages | 3 |
| Journal | e-Journal of Surface Science and Nanotechnology |
| Volume | 11 |
| DOIs | |
| State | Published - 2013/10/19 |
Keywords
- Amorphous thin films
- Bismuth
- EXAFS
ASJC Scopus subject areas
- Biotechnology
- Bioengineering
- Condensed Matter Physics
- Mechanics of Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films