@inproceedings{4de0f7991f454c3f99abfd7c62d03ba0,
title = "EXAFS study of semimetal-semiconductor transition of bismuth clusters",
abstract = "Extended X-ray absorption fine structure (EXAFS) measurements of bismuth clusters in the temperature range of 23 -300 K have been performed using synchrotron radiation in order to investigate the size dependent phase transition. The inter-atomic distances around 3.0 {\AA} and 3.6 {\AA} are attributed to the nearest neighbors within the layer and between layers, respectively. EXAFS functions were analysed by the curve fitting method within a symmetric distribution approximation. The nearest neighbor distance of the 0.5 nm thick films is shorter than that of the 300 nm thick films at all the temperatures, which is related to the reduction of the inter-layer correlation.",
keywords = "Alkali halides, Bismuth, Clusters, EXAFS, Metal-insulator transition",
author = "H. Ikemoto and T. Miyanaga and S. Yoshida and J. Sogoh",
year = "2007",
doi = "10.1063/1.2644551",
language = "英語",
isbn = "0735403848",
series = "AIP Conference Proceedings",
pages = "437--439",
booktitle = "X-RAY ABSORPTION FINE STRUCTURE - XAFS13",
note = "X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference ; Conference date: 09-07-2006 Through 14-07-2006",
}