EUV emission spectra in collisions of multiply charged Sn ions with He and Xe

H. Ohashi*, S. Suda, H. Tanuma, S. Fujioka, H. Nishimura, A. Sasaki, K. Nishihara

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

46 Scopus citations

Abstract

Extreme ultraviolet emission spectra of multiply charged Sn ions were measured in the wavelength range 5-38 nm, following electron capture into the excited states of slow Snq + (q = 5-21) ions passing through He and Xe gas targets. Identification of the transitions was carried out by comparison with calculations using the Hebrew University Livermore Laboratory Atomic physics Code. The target and the charge-state dependences of 4d-nℓ (nℓ = 4f, 5p and 5f) and 4p-4d transitions were observed.

Original languageEnglish
Article number065204
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume43
Issue number6
DOIs
StatePublished - 2010

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

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