Tracking of tritium trapped on/in high-Z materials by BIXS

  • MATSUYAMA, Masao (Principal Investigator)
  • 原, 正憲 (Co-Investigator(Kenkyū-buntansha))
  • Torikai, Yuji (Co-Investigator(Kenkyū-buntansha))
  • 波多野, 雄治 (Co-Investigator(Kenkyū-buntansha))

Project Details

Abstract

When tritium was implanted into the He pre-irradiation sample, the X-ray intensity of Ar was about 5 times great in comparison with the He non-irradiation sample, and no change in the intensity at room temperature was observed for five months. Namely, it was seen that the retention of tritium strongly increased with the He pre-irradiation. The amount of tritium in surface layers decreased with heating, but that in bulk did not change up to 350℃. This indicates that the implanted tritium was strongly trapped at lattice imperfections formed by the He pre-irradiation, and the trapping energy of tritium was estimated to be about 1.2eV.
StatusFinished
Effective start/end date2001/01/01 → 2002/12/31

Funding

  • Japan Society for the Promotion of Science: ¥14,300,000.00

Keywords

  • β線誘起X線計測法
  • トリチウム
  • 非破壊測定
  • プラズマ対向材料
  • 高原子番号材料
  • タングステン
  • モリブデン
  • 拡散挙動
  • 拡散係数
  • tritium
  • nondestructive measurement
  • bremsstrahlung x-ray spectrum
  • characteristic x-ray spectrum
  • depth profile
  • tritium inventory
  • accountability
  • safe handling technique

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