蛍光に着目したマーカを用いた幾何と深層学習の融合によるミリピクセル画像計測

  • 2 Conference contribution
Filter
Conference contribution

Search results

  • 2023

    Displacement measurement with phosphorescent spherical marker

    Terabayashi, K., Hamamoto, Y., Ogasawara, K., Oiwa, T. & Sasaki, T., 2023, Laser Metrology and Machine Performance XV - 15th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2023. Longstaff, A. & Yu, N. (eds.). euspen, p. 185-194 10 p. (Laser Metrology and Machine Performance XV - 15th International Conference and Exhibition on Laser Metrology, Machine Tool, CMM and Robotic Performance, LAMDAMAP 2023).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Marker detection in blurred images for high-precision measurement

    Terabayashi, K., Hamamoto, Y., Ogasawara, K., Oiwa, T. & Sasaki, T., 2023, European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 23rd International Conference and Exhibition, EUSPEN 2023. Riemer, O., Nisbet, C. & Phillips, D. (eds.). euspen, p. 229-230 2 p. (European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 23rd International Conference and Exhibition, EUSPEN 2023).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review