Tsukasa Takanashi - Research output - University of Toyama

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14 Article
1 Conference article

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2020
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
Niozu, A., Kumagai, Y., Nishiyama, T., Fukuzawa, H., Motomura, K., Bucher, M., Ito, Y., Takanashi, T., Asa, K., Sato, Y., You, D., Li, Y., Ono, T., Kukk, E., Miron, C., Neagu, L., Callegari, C., Fraia, M. D., Rossi, G. & Galli, D. E. & 14 others, Pincelli, T., Colombo, A., Kameshima, T., Joti, Y., Hatsui, T., Owada, S., Katayama, T., Togashi, T., Tono, K., Yabashi, M., Matsuda, K., Bostedt, C., Nagaya, K. & Ueda, K., 2020/06/11, In: Journal of Physics: Conference Series. 1412, 20, 202028.
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