Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A. Niozu; Y. Kumagai; T. Nishiyama; H. Fukuzawa; K. Motomura; M. Bucher; Y. Ito; T. Takanashi; K. Asa; Y. Sato; D. You; Y. Li; T. Ono; E. Kukk; C. Miron; L. Neagu; C. Callegari; M. Di Fraia; G. Rossi; D. E. Galli; T. Pincelli; A. Colombo; T. Kameshima; Y. Joti; T. Hatsui; S. Owada; T. Katayama; T. Togashi; K. Tono; M. Yabashi; K. Matsuda; C. Bostedt; K. Nagaya; K. Ueda

doi:10.1088/1742-6596/1412/20/202028

Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A. Niozu, Y. Kumagai, T. Nishiyama, H. Fukuzawa, K. Motomura, M. Bucher, Y. Ito, T. Takanashi, K. Asa, Y. Sato, D. You, Y. Li, T. Ono, E. Kukk, C. Miron, L. Neagu, C. Callegari, M. Di Fraia, G. Rossi, D. E. GalliT. Pincelli, A. Colombo, T. Kameshima, Y. Joti, T. Hatsui, S. Owada, T. Katayama, T. Togashi, K. Tono, M. Yabashi, K. Matsuda, C. Bostedt, K. Nagaya, K. Ueda

Program of Chemistry

Research output: Contribution to journal › Conference article › peer-review

Abstract

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Original language	English
Article number	202028
Journal	Journal of Physics: Conference Series
Volume	1412
Issue number	20
DOIs	https://doi.org/10.1088/1742-6596/1412/20/202028
State	Published - 2020/06/11
Event	31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019 - Deauville, France Duration: 2019/07/23 → 2019/07/30

ASJC Scopus subject areas

General Physics and Astronomy

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10.1088/1742-6596/1412/20/202028

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Niozu, A., Kumagai, Y., Nishiyama, T., Fukuzawa, H., Motomura, K., Bucher, M., Ito, Y., Takanashi, T., Asa, K., Sato, Y., You, D., Li, Y., Ono, T., Kukk, E., Miron, C., Neagu, L., Callegari, C., Fraia, M. D., Rossi, G., ... Ueda, K. (2020). Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays. Journal of Physics: Conference Series, 1412(20), Article 202028. https://doi.org/10.1088/1742-6596/1412/20/202028

@article{c9d1e22d3c344395a6ba81655a32a990,

title = "Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays",

abstract = "We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.",

author = "A. Niozu and Y. Kumagai and T. Nishiyama and H. Fukuzawa and K. Motomura and M. Bucher and Y. Ito and T. Takanashi and K. Asa and Y. Sato and D. You and Y. Li and T. Ono and E. Kukk and C. Miron and L. Neagu and C. Callegari and Fraia, {M. Di} and G. Rossi and Galli, {D. E.} and T. Pincelli and A. Colombo and T. Kameshima and Y. Joti and T. Hatsui and S. Owada and T. Katayama and T. Togashi and K. Tono and M. Yabashi and K. Matsuda and C. Bostedt and K. Nagaya and K. Ueda",

note = "Publisher Copyright: {\textcopyright} 2019 Published under licence by IOP Publishing Ltd.; 31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019 ; Conference date: 23-07-2019 Through 30-07-2019",

year = "2020",

month = jun,

day = "11",

doi = "10.1088/1742-6596/1412/20/202028",

language = "英語",

volume = "1412",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "20",

}

Niozu, A, Kumagai, Y, Nishiyama, T, Fukuzawa, H, Motomura, K, Bucher, M, Ito, Y, Takanashi, T, Asa, K, Sato, Y, You, D, Li, Y, Ono, T, Kukk, E, Miron, C, Neagu, L, Callegari, C, Fraia, MD, Rossi, G, Galli, DE, Pincelli, T, Colombo, A, Kameshima, T, Joti, Y, Hatsui, T, Owada, S, Katayama, T, Togashi, T, Tono, K, Yabashi, M, Matsuda, K, Bostedt, C, Nagaya, K & Ueda, K 2020, 'Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays', Journal of Physics: Conference Series, vol. 1412, no. 20, 202028. https://doi.org/10.1088/1742-6596/1412/20/202028

TY - JOUR

T1 - Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

AU - Niozu, A.

AU - Kumagai, Y.

AU - Nishiyama, T.

AU - Fukuzawa, H.

AU - Motomura, K.

AU - Bucher, M.

AU - Ito, Y.

AU - Takanashi, T.

AU - Asa, K.

AU - Sato, Y.

AU - You, D.

AU - Li, Y.

AU - Ono, T.

AU - Kukk, E.

AU - Miron, C.

AU - Neagu, L.

AU - Callegari, C.

AU - Fraia, M. Di

AU - Rossi, G.

AU - Galli, D. E.

AU - Pincelli, T.

AU - Colombo, A.

AU - Kameshima, T.

AU - Joti, Y.

AU - Hatsui, T.

AU - Owada, S.

AU - Katayama, T.

AU - Togashi, T.

AU - Tono, K.

AU - Yabashi, M.

AU - Matsuda, K.

AU - Bostedt, C.

AU - Nagaya, K.

AU - Ueda, K.

PY - 2020/6/11

Y1 - 2020/6/11

N2 - We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

AB - We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

UR - http://www.scopus.com/inward/record.url?scp=85086717151&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1412/20/202028

DO - 10.1088/1742-6596/1412/20/202028

M3 - 会議記事

AN - SCOPUS:85086717151

SN - 1742-6588

VL - 1412

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 20

M1 - 202028

T2 - 31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019

Y2 - 23 July 2019 through 30 July 2019

ER -

Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Abstract

ASJC Scopus subject areas

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