XAFS analysis on amorphous and crystalline new phase change material GeCu2Te3

K. Kamimura, S. Hosokawa*, N. Happo, H. Ikemoto, Y. Sutou, S. Shindo, Y. Saito, J. Koike

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

5 被引用数 (Scopus)

抄録

The structure of crystalline and amorphous GeCu2Te3 phase change material was investigated by x-ray absorption fine structure. The averaged interatomic distances of Ge-Te and Cu-Te in the crystal phase are confirmed to contradict the x-ray diffraction data, and are mostly equal to the experimental data in the amorphous phase. As regards the coordination numbers, the atomic configurations around the Ge atoms are a small modification of the crystalline one, while those around the Cu atoms are quite different and the large number of the Cu-Cu homopolar coordination become an important role in the amorphous phase. The x-ray absorption near edge structure data near the Ge K edge show a similarity of the local atomic configurations around the Ge atoms between the crystalline and amorphous GeCu2Te3. However, those near the Cu K edge indicate a large smearing-out on the amorphization, corresponding the large differences in the atomic configurations around the Cu atoms.

本文言語英語
ページ(範囲)248-253
ページ数6
ジャーナルJournal of Optoelectronics and Advanced Materials
18
3-4
出版ステータス出版済み - 2016/03/01

ASJC Scopus 主題領域

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 電子工学および電気工学

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