X-ray diffraction study of bismuth nanoparticles

X-ray diffraction (XRD) measurements were carried out in order to investigate the structure of bismuth nanoparticles. The x-ray diffraction profile of the as-deposited sample has broad peaks originated from Bi nanoparticles. The peaks become sharp and the intensities increase with annealing at 300 °CA halo pattern was extracted from analysis of background in the as-deposited samples. The existence of the halo pattern implies that the as-deposited nanoparticles contain of the amorphous phase.