Structural studies on TlInSe2 thermoelectric material by X-ray fluorescence holography, XAFS, and X-ray diffraction

Shinya Hosokawa*, Kenji Kamimura, Hiroyuki Ikemoto, Naohisa Happo, Kojiro Mimura, Kouichi Hayashi, Kohki Takahashi, Kazuki Wakita, Nazim Mamedov

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

12 被引用数 (Scopus)

抄録

The local structure around the Tl atoms in TlInSe2 thermoelectric material was investigated by X-ray fluorescence holography (XFH), XAFS, and X-ray diffraction (XD). The temperature dependent XAFS and XD data reveal that no distinct phase change features are found, and the position of the Tl atoms are fluctuated randomly in the Tl chain direction of the crystal, which is consistent with the XFH result at room temperature. Also, an interference between the positions of Tl and In atoms is suggested by all of these experiments.

本文言語英語
ページ(範囲)1225-1229
ページ数5
ジャーナルPhysica Status Solidi (B) Basic Research
252
6
DOI
出版ステータス出版済み - 2015/06/01

ASJC Scopus 主題領域

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

フィンガープリント

「Structural studies on TlInSe2 thermoelectric material by X-ray fluorescence holography, XAFS, and X-ray diffraction」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル