抄録
The local structure around the Tl atoms in TlInSe2 thermoelectric material was investigated by X-ray fluorescence holography (XFH), XAFS, and X-ray diffraction (XD). The temperature dependent XAFS and XD data reveal that no distinct phase change features are found, and the position of the Tl atoms are fluctuated randomly in the Tl chain direction of the crystal, which is consistent with the XFH result at room temperature. Also, an interference between the positions of Tl and In atoms is suggested by all of these experiments.
本文言語 | 英語 |
---|---|
ページ(範囲) | 1225-1229 |
ページ数 | 5 |
ジャーナル | Physica Status Solidi (B) Basic Research |
巻 | 252 |
号 | 6 |
DOI | |
出版ステータス | 出版済み - 2015/06/01 |
ASJC Scopus 主題領域
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学