抄録
The strain dependence of critical current Ic of a commercial RABiTS (Rolling-Assisted Biaxially Textured Substrates) YBCO coated conductor tape with Cu stabilizing layers on both surfaces has been studied by two kinds of bending apparatus and a tensile apparatus at 77 K and 293 K. According to the voltage measurements using multi-taps in the longitudinal direction, local Ic degradation was also observed. In the continuous bending-tension test at 77 K, in which YBCO layer was subjected to the tensile strain, Ic began to decrease rapidly beyond the strain of 0.6% after initial moderate degradation. In the continuous bending-compression tests, the Ic began to decrease rapidly beyond the strain of 0.4%. The strain for the beginning of degradation of Ic obtained by tensile tests at 77 K was almost the same as that by the bending-tension tests. Bending test at RT using FRP holders showed Ic degradation not so different from that by the continuous bending tests at 77 K. In all tests, the Ic initially degraded locally irrespective of the position in the specimens. Furthermore, Ic degradation by repeated bending was also studied.
本文言語 | 英語 |
---|---|
ページ(範囲) | 1697-1701 |
ページ数 | 5 |
ジャーナル | Physica C: Superconductivity and its Applications |
巻 | 468 |
号 | 15-20 |
DOI | |
出版ステータス | 出版済み - 2008/09/15 |
ASJC Scopus 主題領域
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- エネルギー工学および電力技術
- 電子工学および電気工学