Reciprocal space map measurement of ceramics thin films for unequal lattice change at high temperature

Keyphrases

• High Temperature 100%
• Ceramic Thin Films 100%
• Reciprocal Space Mapping 100%
• CeO2 Thin Films 66%
• YSZ Thin Film 66%
• Thermal Coefficient 66%
• Increased Temperature 33%
• Lattice Parameter 33%
• Si(111) 33%
• Film Surface 33%
• Zirconia 33%
• Deposition Temperature 33%
• Fuel Cell 33%
• Oxygen Sensor 33%
• Buffer Layer 33%
• Film Thickness 33%
• Lattice Constant 33%
• Electric Devices 33%
• Si Substrate 33%
• Chemical Stability 33%
• Epitaxially Grown 33%
• SrTiO3 33%
• Ceria 33%
• Film Deposition 33%
• Substrate Surface 33%
• Heater 33%
• Optical Coatings 33%
• Anticorrosive Coating 33%
• Ionic Conductor 33%
• Sample Stage 33%
• Film Orientation 33%
• Distortion Rate 33%
• Coating Corrosion 33%
• Thermomechanical Stability 33%
• Thermal Shield 33%
• Thermal Optical 33%

Engineering

• Thin Films 100%
• Reciprocal Space 100%
• Yttria-Stabilized Zirconia 50%
• Lattice Constant 33%
• Increasing Temperature 16%
• Buffer Layer 16%
• Si Substrate 16%
• Deposition Temperature 16%
• Film Surface 16%
• Resistant Coating 16%
• Substrate Surface 16%
• Film Orientation 16%
• Distortion Rate 16%
• Lattice Parameter 16%
• Fuel Cell 16%

Material Science

• Thin Films 100%
• Cerium Oxide 100%
• Surface (Surface Science) 50%
• Film 33%
• Lattice Constant 33%
• Corrosion Resistance 16%
• Film Thickness 16%
• Zirconia 16%
• Buffer Layer 16%
• Film Deposition 16%
• Solid Electrolyte 16%
• Optical Coating 16%