Probing defects in Al-Mg-Si alloys using muon spin relaxation

Sigurd Wenner*, Randi Holmestad, Kenji Matsuda, Katsuhiko Nishimura, Teiichiro Matsuzaki, Dai Tomono, Francis L. Pratt, Calin D. Marioara

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

21 被引用数 (Scopus)

抄録

Muon spin methods are very sensitive to nanoscale defects such as trace elements and vacancies in metals. This sensitivity is required when investigating Al-Mg-Si alloys, a complicated system in which diffusion-controlled phase transformations are responsible for the most important hardening mechanisms. We present muon spin relaxation experiments conducted on Al-Mg-Si alloys at measurement temperatures in the range 20-300K. Varying the alloy composition and heat treatment, we find differences in muon depolarization in several temperature regimes. This reflects differences in concentration of several types of muon-trapping defects. We identify free solute atom and vacancy regimes, and confirm that the concentration of these defects decreases when an alloy is annealed at low temperature. We further attribute one regime to Mg-Si vacancy clustering, a mechanism required for precipitation hardening during aging. After storage at room temperature, muon trapping in this regime is more pronounced for a Mg-rich alloy than a Mg-Si-balanced alloy.

本文言語英語
論文番号104201
ジャーナルPhysical Review B - Condensed Matter and Materials Physics
86
10
DOI
出版ステータス出版済み - 2012/09/04

ASJC Scopus 主題領域

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

フィンガープリント

「Probing defects in Al-Mg-Si alloys using muon spin relaxation」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル