抄録
X-ray diffraction patterns, extended X-ray absorption fine structure, and optical absorption coefficients were measured in order to investigate the size-dependence of structural and optical phase transitions of bismuth clusters. Contrary to the case of 15-nm thick films, peaks due to crystalline Bi were not observed in X-ray diffraction patterns of as-deposited 0.5-nm thick films. Optical absorption coefficients of the 0.5-nm thick films are small compared with those of 100-nm thick films, and an optical gap appears in the 0.5-nm thick films. These results show directly the phase transition of bismuth clusters from semi-metallic nanocrystalline to semiconducting amorphous-like clusters with decreasing size.
本文言語 | 英語 |
---|---|
ページ(範囲) | 3394-3398 |
ページ数 | 5 |
ジャーナル | Journal of Non-Crystalline Solids |
巻 | 353 |
号 | 32-40 |
DOI | |
出版ステータス | 出版済み - 2007/10/15 |
ASJC Scopus 主題領域
- 電子材料、光学材料、および磁性材料
- セラミックおよび複合材料
- 凝縮系物理学
- 材料化学