抄録
A new program called miXAFS for the analysis of X-ray absorption fine-structure (XAFS) data is presented. miXAFS can analyze the XAFS functions simultaneously for all measured X-ray absorption edges of the constituent elements in a sample under the constraints for the structural parameters over the edges. The program provides a surface plot of the R-factor as a function of two structural parameters, which is useful to validate the optimized structural parameters. The structural parameters can be obtained from the XAFS data in a few steps using the setting file and batch process. The program, which is coded in MATLAB and freely available, runs on Macintosh and Windows operating systems. It has a graphical user interface and loads experimental data and XAFS functions in a variety of ASCII data formats.miXAFS is a program for analyzing X-ray absorption fine-structure (XAFS) data. It can analyze the XAFS functions simultaneously for all the obtained X-ray absorption edges and provide a surface plot of R-factor against two structural parameters.
本文言語 | 英語 |
---|---|
ページ(範囲) | 618-624 |
ページ数 | 7 |
ジャーナル | Journal of Synchrotron Radiation |
巻 | 25 |
号 | 2 |
DOI | |
出版ステータス | 出版済み - 2018/03 |
ASJC Scopus 主題領域
- 放射線
- 核物理学および高エネルギー物理学
- 器械工学