Highly Sensitive Sensing of Refractive Index Using Surface Lattice Resonance in Capacitive Metal Meshes at Millimeter Wave Frequencies

Jongsuck Bae, Tatsuo Nozokido*

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

2 被引用数 (Scopus)

抄録

We propose the use of surface lattice resonance (SLR) in capacitive metal meshes (CMMs) to permit highly sensitive measurement of the refractive index (RI) in the millimeter wave (MMW) range. CMMs, which comprise 2-D periodic arrays of square metal patches on thin quartz substrates, are one of the simplest and most classical metasurfaces. Experiments and numerical simulations performed at frequencies around 0.1 THz show that SLRs in such CMMs have extraordinarily high unloaded Q factors of greater than 1000, when the ratio of the length of the metal patch to the mesh period of the CMM and the thickness of the quartz substrate are optimized. An intense and sharp dip in transmission in excess of -60 dB at the SLR frequency with this high unloaded Q factor was produced in a CMM. Using a CMM as an RI sensor, a figure of merit (FoM) of greater than 340 for frequency interrogation and an RI resolution of better than 1.9× 10-6 RI units for phase interrogation were experimentally demonstrated. These results indicate that CMMs are superior sensors with high performance in the MMW region.

本文言語英語
ページ(範囲)25927-25937
ページ数11
ジャーナルIEEE Sensors Journal
23
21
DOI
出版ステータス出版済み - 2023/11/01

ASJC Scopus 主題領域

  • 器械工学
  • 電子工学および電気工学

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