Fundamental studies on fast scan stripping voltammetry with a microelectrode

Satoshi Nomura, Koichi Nozaki, Satoshi Okazaki*

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

12 被引用数 (Scopus)

抄録

Application of rapid‐response voltammetry to stripping analysis was carried out, and novel fast scan stripping voltammetry (FSSV) was developed. A remarkable increase in analytical sensitivity could be attained as a result of the minimization of the background current through the use of an ultramicrodisk electrode (UMDE) and the fast scan rate of 300 V/s. The interference of dissolved oxygen and copper ion were greatly eliminated owing to their slow charge transfer rate. This new type of stripping method also turned out to be a rapid and reliable analytical method.

本文言語英語
ページ(範囲)617-624
ページ数8
ジャーナルElectroanalysis
3
7
DOI
出版ステータス出版済み - 1991/08

ASJC Scopus 主題領域

  • 分析化学
  • 電気化学

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