抄録
Extended X-ray absorption fine structure (EXAFS) measurements were carried out in order to investigate the phase transition of bismuth clusters from semi-metallic nanocrystal to semiconducting amorphousness depending on the size. XAFS functions were Fourier-transformed and analyzed by the curve fitting method. The peaks around 3.0 Å and 3.6 Å are attributed to the nearest neighbors within the layer and between the interlayer, respectively. In the 0.5 nm thick films the covalent bond length within the layer slightly shortens and the peak originated from the interlayer disappears.
| 本文言語 | 英語 |
|---|---|
| ページ（範囲） | 370-372 |
| ページ数 | 3 |
| ジャーナル | e-Journal of Surface Science and Nanotechnology |
| 巻 | 3 |
| DOI | |
| 出版ステータス | 出版済み - 2005/12/03 |
ASJC Scopus 主題領域
- バイオテクノロジー
- バイオエンジニアリング
- 凝縮系物理学
- 材料力学
- 表面および界面
- 表面、皮膜および薄膜