4f-derived fermi surfaces of CeRu2(Si1-xGex)2 near the quantum critical point: Resonant soft-X-ray ARPES study

T. Okane*, T. Ohkochi, Y. Takeda, S. I. Fujimori, A. Yasui, Y. Saitoh, H. Yamagami, A. Fujimori, Y. Matsumoto, M. Sugi, N. Kimura, T. Komatsubara, H. Aoki

*この論文の責任著者

研究成果: ジャーナルへの寄稿学術論文査読

30 被引用数 (Scopus)

抄録

Angle-resolved photoelectron spectroscopy in the Ce 3d→4f excitation region was measured for the paramagnetic state of CeRu2Si2, CeRu2(Si0.82Ge0.18) 2, and LaRu2Si2 to investigate the changes of the 4f electron Fermi surfaces around the quantum critical point. While the difference of the Fermi surfaces between CeRu2Si2 and LaRu2Si2 was experimentally confirmed, a strong 4f-electron character was observed in the band structures and the Fermi surfaces of CeRu2Si2 and CeRu2(Si0.82Ge0.18)2, consequently indicating a delocalized nature of the 4f electrons in both compounds. The absence of Fermi surface reconstruction across the critical composition suggests that SDW quantum criticality is more appropriate than local quantum criticality in CeRu2(Si1-xGex)2.

本文言語英語
論文番号216401
ジャーナルPhysical Review Letters
102
21
DOI
出版ステータス出版済み - 2009/05/26

ASJC Scopus 主題領域

  • 物理学および天文学一般

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