Site-specific electron-relaxation caused by Si:2p core-level photoionization: Comparison between F3SiCH2CH2Si(CH3)3 and Cl3SiCH2CH2Si(CH3)3 vapors by means of photoelectron auger electron coincidence spectroscopy

Shin Ichi Nagaoka*, Takuhiro Kakiuchi, Joji Ohshita, Osamu Takahashi, Yasumasa Hikosaka

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Site-specific electron relaxations caused by Si:2p core-level photoionizations in F3SiCH2CH2Si(CH3)3 and Cl3SiCH2CH2Si(CH3)3 vapors have been studied by means of the photoelectron Auger electron coincidence spectroscopy. F3SiCH2CH2Si(CH3)3 shows almost 100% site-specificity in fragmentation caused by the Si:2p ionization. However, substitution of Cl for F of F3SiCH2CH2Si(CH3)3 considerably reduces the site-specificity at the Si atom bonded to three halogen atoms, with the site-specificity at the Si site bonded to three methyl groups remaining largely unchanged. The site-specificity reduction in Cl3SiCH2CH2Si(CH3)3 is considered to take place during the transient period between Si: L23VV Auger electron emission and the subsequent fragmentation. The reason for the reduction can be explained in terms of some differences between these two molecules in the L23VV Auger decay at the Si site bonded to the three halogen atoms.

Original languageEnglish
Pages (from-to)9907-9915
Number of pages9
JournalJournal of Physical Chemistry A
Volume120
Issue number50
DOIs
StatePublished - 2016/11/28

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

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