Role of Bias Electric Field for X-ray Diffraction Intensity by TGS Crystal in Transverse Electric Field

Seigo Tsuge, Toshio Kikuta*, Toshinari Yamazaki, Bogusław Fugiel

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

X-ray diffraction intensity of triglycine sulfate single crystals influenced by the transverse electric field has been measured in the bias electric field. Polarity of domains in the sample can be judged by variation in intensity associated with polarity of the bias field. Polarity of the domains does not change by the bias field after prolonged transverse field application. There seems to be still positive domains even in the negative bias field and vice versa. Polarity of the domains seems to be randomly aligned without any relation to polarity of the bias field after the prolonged application.

Original languageEnglish
Pages (from-to)27-33
Number of pages7
JournalFerroelectrics
Volume485
Issue number1
DOIs
StatePublished - 2015/08/26

Keywords

  • Transverse electric field
  • X-ray diffraction
  • polarization reversal
  • triglycine sulfate

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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