Passive millimeter-wave microscopy

Tatsuo Nozokido; Masamitsu Noto; Tadakuni Murai

doi:10.1109/LMWC.2009.2029741

Passive millimeter-wave microscopy

Tatsuo Nozokido^*, Masamitsu Noto, Tadakuni Murai

^*Corresponding author for this work

Electric and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

A new type of millimeter-wave imaging technique, passive millimeter-wave microscopy is proposed and demonstrated. Passive millimeter-wave imaging techniques when combined with scanning near-field microscopy enable direct observation of millimeter-wave signals thermally emitted from the viewed object with a spatial resolution below the diffraction limit. Details of our passive microscope system operating at Ka-band frequencies are explained. Millimeter-wave images obtained with the system are presented to demonstrate the feasibility of this new imaging technique.

Original language	English
Article number	5233756
Pages (from-to)	638-640
Number of pages	3
Journal	IEEE Microwave and Wireless Components Letters
Volume	19
Issue number	10
DOIs	https://doi.org/10.1109/LMWC.2009.2029741
State	Published - 2009/10

Keywords

Millimeter-wave
Passive imaging
Scanning near-field microscopy

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/LMWC.2009.2029741

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title = "Passive millimeter-wave microscopy",

abstract = "A new type of millimeter-wave imaging technique, passive millimeter-wave microscopy is proposed and demonstrated. Passive millimeter-wave imaging techniques when combined with scanning near-field microscopy enable direct observation of millimeter-wave signals thermally emitted from the viewed object with a spatial resolution below the diffraction limit. Details of our passive microscope system operating at Ka-band frequencies are explained. Millimeter-wave images obtained with the system are presented to demonstrate the feasibility of this new imaging technique.",

keywords = "Millimeter-wave, Passive imaging, Scanning near-field microscopy",

author = "Tatsuo Nozokido and Masamitsu Noto and Tadakuni Murai",

note = "Funding Information: Manuscript received March 26, 2009; revised July 10, 2009. First published September 09, 2009; current version published September 23, 2009. This work was supported in part by a Grant-In-Aid for Scientific Research 19360158 from the Japan Society for the Promotion of Science (JSPS).",

year = "2009",

month = oct,

doi = "10.1109/LMWC.2009.2029741",

language = "英語",

volume = "19",

pages = "638--640",

journal = "IEEE Microwave and Wireless Components Letters",

issn = "1531-1309",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10",

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T1 - Passive millimeter-wave microscopy

AU - Nozokido, Tatsuo

AU - Noto, Masamitsu

AU - Murai, Tadakuni

N1 - Funding Information: Manuscript received March 26, 2009; revised July 10, 2009. First published September 09, 2009; current version published September 23, 2009. This work was supported in part by a Grant-In-Aid for Scientific Research 19360158 from the Japan Society for the Promotion of Science (JSPS).

PY - 2009/10

Y1 - 2009/10

N2 - A new type of millimeter-wave imaging technique, passive millimeter-wave microscopy is proposed and demonstrated. Passive millimeter-wave imaging techniques when combined with scanning near-field microscopy enable direct observation of millimeter-wave signals thermally emitted from the viewed object with a spatial resolution below the diffraction limit. Details of our passive microscope system operating at Ka-band frequencies are explained. Millimeter-wave images obtained with the system are presented to demonstrate the feasibility of this new imaging technique.

AB - A new type of millimeter-wave imaging technique, passive millimeter-wave microscopy is proposed and demonstrated. Passive millimeter-wave imaging techniques when combined with scanning near-field microscopy enable direct observation of millimeter-wave signals thermally emitted from the viewed object with a spatial resolution below the diffraction limit. Details of our passive microscope system operating at Ka-band frequencies are explained. Millimeter-wave images obtained with the system are presented to demonstrate the feasibility of this new imaging technique.

KW - Millimeter-wave

KW - Passive imaging

KW - Scanning near-field microscopy

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M3 - 学術論文

AN - SCOPUS:70350621780

SN - 1531-1309

VL - 19

SP - 638

EP - 640

JO - IEEE Microwave and Wireless Components Letters

JF - IEEE Microwave and Wireless Components Letters

IS - 10

M1 - 5233756

ER -

Passive millimeter-wave microscopy

Abstract

Keywords

ASJC Scopus subject areas

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