Millimeter-wave scattering microscopy using a knife blade as a scanning probe

Yuya Nakahashi*, Yasunori Ohmiya, Kazuhiro Yamamoto, Tatsuo Nozokido

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We report on the use of a knife blade as a scanning probe for scattering-type scanning near-field microscopy at millimeter wavelengths. Since the knife blade probe is a wider version of the metal tip antenna (whisker antenna) widely used in the terahertz and infrared regions, an improvement in signal intensity, and hence in the image contrast was expected. A scanning method and an image reconstruction algorithm based on computerized tomography were used to obtain 2-D near-field images. Experiments performed at 60 GHz using a knife blade with a tip radius of 6 m (∼λ/1000) showed that the signal intensity was enhanced by 20 dB compared with a metal tip antenna with an equivalent tip radius, and that an image resolution approaching the tip radius of the knife blade was achieved.

Original languageEnglish
Title of host publicationAsia-Pacific Microwave Conference Proceedings, APMC 2011
Pages1578-1581
Number of pages4
StatePublished - 2011
EventAsia-Pacific Microwave Conference, APMC 2011 - Melbourne, VIC, Australia
Duration: 2011/12/052011/12/08

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC

Conference

ConferenceAsia-Pacific Microwave Conference, APMC 2011
Country/TerritoryAustralia
CityMelbourne, VIC
Period2011/12/052011/12/08

Keywords

  • Knife blades
  • millimeter-wave imaging
  • near-field probes
  • scanning near-field microscopy
  • scattering microscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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