TY - GEN
T1 - Microstructure of the new route wire fabrication of V3Ga compound superconducting wire using high Ga content Cu-Ga/V precursor composite material
AU - Murakami, Satoshi
AU - Mizutani, Manabu
AU - Matsuda, Kenji
AU - Nishimura, Katsuhiko
AU - Kawabata, Tokimasa
AU - Hishinuma, Yoshimitsu
PY - 2012
Y1 - 2012
N2 - Our co-worker, Hishinuma et. al. has established a new route Powder-In-Tube (PIT) process using a high Ga content Cu-Ga compound in order to improve the superconducting property of the V 3Ga compound wire. In this study, we investigated microstructure of this high Ga content Cu-Ga/V composite superconducting wire. The different contrasts of matrix, V-Ga phase and Cu-Ga core were observed by SEM observation in cross section of 19 multifilamentary wire. And V-Ga phase was confirmed by SEM mapping. The area fraction of V-Ga phase increased when Ga content increased from 30% to 50%. Thin film sample with V-Ga phase for TEM was fabricated by FIB and observed by TEM in detail. Selected area diffraction pattern was obtained for V matrix, V-Ga phase and Cu-Ga core. The ratio of V to Ga for V-Ga phase was probably V 3Ga according to the EDS result. There was a linear interface between V matrix and V-Ga phase, while the interface between Cu-Ga core and V-Ga phase was not linear. On the other hand, there were some granular grains observed in V-Ga phase wear Cu-Ga core.
AB - Our co-worker, Hishinuma et. al. has established a new route Powder-In-Tube (PIT) process using a high Ga content Cu-Ga compound in order to improve the superconducting property of the V 3Ga compound wire. In this study, we investigated microstructure of this high Ga content Cu-Ga/V composite superconducting wire. The different contrasts of matrix, V-Ga phase and Cu-Ga core were observed by SEM observation in cross section of 19 multifilamentary wire. And V-Ga phase was confirmed by SEM mapping. The area fraction of V-Ga phase increased when Ga content increased from 30% to 50%. Thin film sample with V-Ga phase for TEM was fabricated by FIB and observed by TEM in detail. Selected area diffraction pattern was obtained for V matrix, V-Ga phase and Cu-Ga core. The ratio of V to Ga for V-Ga phase was probably V 3Ga according to the EDS result. There was a linear interface between V matrix and V-Ga phase, while the interface between Cu-Ga core and V-Ga phase was not linear. On the other hand, there were some granular grains observed in V-Ga phase wear Cu-Ga core.
KW - FIB
KW - Multifilament
KW - SEM
KW - Superconducting wire
KW - TEM
KW - V3Ga
UR - http://www.scopus.com/inward/record.url?scp=84855243119&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.409.205
DO - 10.4028/www.scientific.net/AMR.409.205
M3 - 会議への寄与
AN - SCOPUS:84855243119
SN - 9783037853047
T3 - Advanced Materials Research
SP - 205
EP - 208
BT - THERMEC 2011 Supplement
T2 - 7th International Conference on Processing and Manufacturing of Advanced Materials, THERMEC'2011
Y2 - 1 August 2011 through 5 August 2011
ER -