Measurements of strain fields due to nanoscale precipitates using the phase image method

Patricia Donnadieu; Kenji Matsuda; Thierry Epicier; Joel Douin

doi:10.5566/ias.v20.p213-218

Measurements of strain fields due to nanoscale precipitates using the phase image method

Patricia Donnadieu^*, Kenji Matsuda, Thierry Epicier, Joel Douin

^*Corresponding author for this work

Materials Design and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.

Original language	English
Pages (from-to)	213-218
Number of pages	6
Journal	Image Analysis and Stereology
Volume	20
Issue number	3
DOIs	https://doi.org/10.5566/ias.v20.p213-218
State	Published - 2001

Keywords

Displacement field
HREM
Phase image

ASJC Scopus subject areas

Biotechnology
Signal Processing
Materials Science (miscellaneous)
General Mathematics
Instrumentation
Radiology Nuclear Medicine and imaging
Acoustics and Ultrasonics
Computer Vision and Pattern Recognition

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10.5566/ias.v20.p213-218

Cite this

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title = "Measurements of strain fields due to nanoscale precipitates using the phase image method",

abstract = "Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.",

keywords = "Displacement field, HREM, Phase image",

author = "Patricia Donnadieu and Kenji Matsuda and Thierry Epicier and Joel Douin",

note = "Publisher Copyright: {\textcopyright} 2001, Slovenian Society For Stereology And Quantitative Image Analysis.",

year = "2001",

doi = "10.5566/ias.v20.p213-218",

language = "英語",

volume = "20",

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T1 - Measurements of strain fields due to nanoscale precipitates using the phase image method

AU - Donnadieu, Patricia

AU - Matsuda, Kenji

AU - Epicier, Thierry

AU - Douin, Joel

PY - 2001

Y1 - 2001

N2 - Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.

AB - Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.

KW - Displacement field

KW - HREM

KW - Phase image

UR - http://www.scopus.com/inward/record.url?scp=85087210813&partnerID=8YFLogxK

U2 - 10.5566/ias.v20.p213-218

DO - 10.5566/ias.v20.p213-218

M3 - 学術論文

AN - SCOPUS:85087210813

SN - 1580-3139

VL - 20

SP - 213

EP - 218

JO - Image Analysis and Stereology

JF - Image Analysis and Stereology

IS - 3

ER -

Measurements of strain fields due to nanoscale precipitates using the phase image method

Abstract

Keywords

ASJC Scopus subject areas

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